TechNavio's analysts forecast the Global Thin Film Metrology Systems market to grow at a CAGR of 5.02 percent over the period 2013-2018. One of the key factors contributing to this market growth is the high demand for thin film metrology systems for the development of flat panel displays. The Global Thin Film Metrology Systems market has also been witnessing the increased R&D spending by vendors. However, the cyclical nature of the semiconductor industry could pose a challenge to the growth of this market.... Research Beam Model: Research Beam Product ID: 17583 2500 USD New
Global Thin Film Metrology Systems Market 2014-2018
 
 

Global Thin Film Metrology Systems Market 2014-2018

  • Category : Semiconductor and Electronics
  • Published On : January   2014
  • Pages : 50
  • Publisher : Technavio
 
 
 

TechNavio's analysts forecast the Global Thin Film Metrology Systems market to grow at a CAGR of 5.02 percent over the period 2013-2018. One of the key factors contributing to this market growth is the high demand for thin film metrology systems for the development of flat panel displays. The Global Thin Film Metrology Systems market has also been witnessing the increased R&D spending by vendors. However, the cyclical nature of the semiconductor industry could pose a challenge to the growth of this market. 

TechNavio's report, the Global Thin Film Metrology Systems Market 2014-2018, has been prepared based on an in-depth market analysis with inputs from industry experts. The report covers the Americas, EMEA, and APAC; it also covers the Global Thin Film Metrology Systems market landscape and its growth prospects in the coming years. The report also includes a discussion of the key vendors operating in this market.

Key vendors dominating this space include Nanometrics Inc., Nova Measuring Instruments, KLA-Tencor Corp., and Rudolph Technologies Inc.

Other vendors mentioned in the report are Dainippon Screen Mfg Co. Ltd., FIE Co., HORIBA Ltd., Jordan Valley Semiconductors Ltd., Ocean Optics Inc., ReVera Inc., Semilab Co. Ltd., Scientific Computing International, and Windsor Scientific

Key questions answered in this report: 

What will the market size be in 2018 and what will be the growth rate?

What are key market trends?

What is driving this market?

What are the challenges to market growth?

Who are the key vendors in this market space?

What are the market opportunities and threats faced by key vendors?

What are the strengths and weaknesses of each of these key vendors?

You can request one free hour of our analyst’s time when you purchase this market report. Details provided within the report.



 


01. Executive Summary

02. List of Abbreviations

03. Scope of the Report


03.1 Market Overview

03.2 Product Offerings

04. Market Research Methodology

04.1 Market Research Process

04.2 Research Methodology

05. Introduction

06. Market Landscape


06.1 Market Size and Forecast

06.2 Five Forces Analysis

07. Geographical Segmentation

07.1 Global Thin Film Metrology Systems Market by Geographical Segmentation 2013

07.2 Thin Film Metrology Systems Market in the APAC Region

07.2.1 Market Size and Forecast

07.3 Thin Film Metrology Systems Market in the Americas

07.3.1 Market Size and Forecast

07.4 Thin Film Metrology Systems Market in the EMEA Region

07.4.1 Market Size and Forecast

08. Key Leading Countries

08.1 South Korea

08.2 US

08.3 Taiwan

09. Buying Criteria

10. Market Growth Drivers

11. Drivers and their Impact

12. Market Challenges

13. Impact of Drivers and Challenges

14. Market Trends

15. Trends and their Impact

16. Vendor Landscape


16.1 Competitive Scenario

16.2 Other Prominent Vendors

17. Key Vendor Analysis

17.1 Nanometrics Inc.

17.1.1 Business Overview

17.1.2 SWOT Analysis

17.2 Nova Measuring Instruments

17.2.1 Business Overview

17.2.2 SWOT Analysis

17.3 KLA-Tencor Corp.

17.3.1 Business Overview

17.3.2 Business Segmentation of KLA-Tencor Corp. 2013

17.3.3 SWOT Analysis

17.4 Rudolph Technologies Inc.

17.4.1 Business Overview

17.4.2 Business Segmentation of Rudolph Technologies Inc. 2013

17.4.3 SWOT Analysis

18. Other Reports in this Series



List of Exhibits



Exhibit 1: Market Research Methodology

Exhibit 2: Global Thin Film Metrology Systems Market 2013-2018 (US$ million)

Exhibit 3: Global Thin Film Metrology Systems Market by Geographical Segmentation 2013

Exhibit 4: Thin Film Metrology Systems Market in the APAC Region 2013-2018 (US$ million)

Exhibit 5: Thin Film Metrology Systems Market in the Americas 2013-2018 (US$ million)

Exhibit 6: Thin Film Metrology Systems Market in the EMEA Region 2013-2018 (US$ million)

Exhibit 7: Thin Film Metrology Systems Market in South Korea 2013-2018 (US$ million)

Exhibit 8: Thin Film Metrology Systems Market in the US 2013-2018 (US$ million)

Exhibit 9: Taiwan Thin Film Metrology Systems Market 2013-2018 (US$ million)

Exhibit 10: Business Segmentation of KLA-Tencor Corp. 2013

Exhibit 11: Business Segmentation of KLA-Tencor Corp. FY2013

Exhibit 12: Business Segmentation of Rudolph Technologies Inc. 2013

Exhibit 13: Business Segmentation of Rudolph Technologies Inc. by Revenue 2013



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